Branch of thin physical methods of research of materials structure

Structure

• Laboratory of electronic microscopy and x-ray and spectral microanalysis
• Laboratory of x-ray and spectral analysis

The equipment: raster electronic microscope JSM-6510LV JEOL

Raster electronic microscope JSM-6510LV JEOL (Japan) with system of microanalysis INCA Energy 350, Oxford Instruments (Great Britain), year of release – 2008.

The electronic raster microscope is intended for research of thin structure of biological, polymeric, building materials, glasses, metals, alloys etc. in secondary, reflected and absorbed electrons, and also for research of surface of breaks by visual supervision and photoengraving. The low vacuum operating mode allows investigating samples without dusting a current-carrying layer, including biological and polymeric materials, glasses, petro parent breeds etc. Built in x-ray and spectral analyzer INCA Energy 350 allows carrying out the analysis in a point, on a profile and mapping according to the area.

Technical characteristics

Rendered services

• Carrying out of researches of various materials surface with the high permission in two modes (HV, LV).
• Research of breaks and damages of surface for the purpose of revealing of features of destruction surface.
• Definition of qualitative and quantitative structure of samples in a range of elements from borium to uranium.

Personnel structure

• Engineer - Mishigdorzhijn Undrah Lhagvasurenovich
• Engineer - Zhigzhitova Sesegma Batoevna , D.Sc

Laboratory of x-ray and structural analysis

The equipment: x-ray diffractometer DRON-7

The equipment - x-ray diffractometer DRON-7, НПП "Petrel", St.-Petersburg, year of release – 2008.

X-ray diffractometer of general purpose is intended for measurement of intensity and corners of diffraction of the x-ray radiation diffracted on crystal object, for the decision of problems of x-ray diffraction and x-ray structural analysis of materials.

X-ray diffraction measuring allows carrying out thanks to use of nondestructive method:

• Control of phase structure of substance;
• Definition of metrics of a crystal lattice;
• Reveal of various types of defects;
• Analysis of strained and textured conditions;
• Research of nuclear structure.

Scopes: organic and inorganic chemistry, physics of a firm body, electronics, geology and the mining industry, mineralogy, metallurgy, mechanical engineering, building, materials technology, pharmacology, criminalistics etc.

Technical characteristics:

Rendered services

• The qualitative analysis of phase structure of materials, production, raw materials and industrial wastes;
• Research of phase transformations and reactions;
• The analysis of changes of structural characteristics of crystal materials.

Personnel structure:

Engineer - Alsagarov Vladimir Ilich